Obtaining the scattering rate of different Tc0 FeSe thin films via spectroscopic ellipsometry-Reference-Cited by-同舟云学术

Obtaining the scattering rate of different Tc0 FeSe thin films via spectroscopic ellipsometry

Published:2019-09 Issue:5 Volume:37 Page:052907
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Shi Yujun¹,Lian Jie¹,Feng Zhongpei²,Zhao Minglin³,Jin Kui²,Song Haonan¹,Wei Mingyang¹,Dai Kai¹,Jiang Qingfen¹,Fang Jiaxiong⁴

Affiliation:

1. School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China

2. National Lab for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

3. Department of Physics, Jiangsu University of Science and Technology, Zhenjiang 212003, Jiangsu, China

4. Advanced Research Center for Optics, Shandong University, Jinan 250100, Shandong, China

Funder

the Key Research and Development Project of Shandong Province

the National Key Basic Research Program of China

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.5119394

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