Obtaining the scattering rate of different Tc0 FeSe thin films via spectroscopic ellipsometry

Author:

Shi Yujun1,Lian Jie1,Feng Zhongpei2,Zhao Minglin3,Jin Kui2,Song Haonan1,Wei Mingyang1,Dai Kai1,Jiang Qingfen1,Fang Jiaxiong4

Affiliation:

1. School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China

2. National Lab for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

3. Department of Physics, Jiangsu University of Science and Technology, Zhenjiang 212003, Jiangsu, China

4. Advanced Research Center for Optics, Shandong University, Jinan 250100, Shandong, China

Funder

the Key Research and Development Project of Shandong Province

the National Key Basic Research Program of China

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

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