Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1−XGeX and Fe1−X NiX binary alloys-Reference-Cited by-同舟云学术

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Comparison of quantitative analyses using SIMS, atom probe tomography, and femtosecond laser ablation inductively coupled plasma mass spectrometry with Si1−XGeX and Fe1−X NiX binary alloys

Published:2020-05 Issue:3 Volume:38 Page:034009
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B
language:en
Short-container-title:Journal of Vacuum Science & Technology B

Author:

Jang Yun Jung¹²^ORCID,Kim Seon Hee¹,Kim Kyung Joong³,Kim Donghwan²⁴,Lee Yeonhee¹^ORCID

Affiliation:

1. Advanced Analysis Center, Korea Institute of Science and Technology, Seoul 02792, Korea

2. Department of Materials Science and Engineering, Korea University, Seoul 02841, Korea

3. Division of Advanced Technology, Korea Research Institute of Standards and Science, Daejeon 34113, Korea

4. KU-KIST Green School Graduate School of Energy and Environment, Korea University, Seoul 02841, Korea

Funder

Korean ministry of science, ICT

National Research Council of Science and Technology

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/6.0000101

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative aspects of ToF-SIMS analysis of metals and alloys in a UHV, O2 and H2 atmosphere;Surfaces and Interfaces;2024-06

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