XPS depth profiling of organic photodetectors with the gas cluster ion beam-Reference-Cited by-同舟云学术

XPS depth profiling of organic photodetectors with the gas cluster ion beam

Published:2016-05 Issue:3 Volume:34 Page:03H119
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Haberko Jakub¹,Marzec Mateusz M.²,Bernasik Andrzej³,Łużny Wojciech¹,Lienhard Pierre⁴,Pereira Alexandre⁵,Faure-Vincent Jérôme⁴,Djurado David⁴,Revaux Amélie⁵

Affiliation:

1. Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland

2. Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland

3. Academic Centre for Materials and Nanotechnology and Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland

4. Institut des NAnosciences et de Cryogénie (INAC)–Laboratoire Structures et Propriétés d'Architectures Moléculaires (SPrAM), Commissariat à l'Energie Atomique et aux énergies alternatives CEA, Grenoble 38054, France

5. Laboratoire d'Innovation pour les Technologies des Energies Nouvelles et les Nanomatériaux (LITEN), Laboratoire de Fiabilité et de Vieillissement des Composants(LFVC), Commissariat à l'Energie Atomique et aux énergies alternatives CEA, Grenoble 38054, France

Funder

Polish National Science Centre

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4943028

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantifying the Damage Induced by X-ray Photoelectron Spectroscopy Depth Profiling of Organic Conjugated Polymers;ACS Applied Polymer Materials;2019-04-22

2. Use of gas cluster ion source depth profiling to study the oxidation of fullerene thin films by XPS;Organic Electronics;2017-10

3. X-ray Photoelectron Spectroscopy Analysis of Hydrotreated Athabasca Asphaltenes;Energy & Fuels;2017-09-15