Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities-Reference-Cited by-同舟云学术

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Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities

Published:2020-12 Issue:6 Volume:38 Page:063203
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A
language:en
Short-container-title:Journal of Vacuum Science & Technology A

Author:

Engelhard Mark H.¹^ORCID,Baer Donald R.¹^ORCID,Herrera-Gomez Alberto²^ORCID,Sherwood Peter M. A.³^ORCID

Affiliation:

1. Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99354

2. CINVESTAV—Unidad Queretaro, Queretaro 76230, Mexico

3. Department of Chemistry, University of Washington, Box 351700, Seattle, Washington 98195

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/6.0000359

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