Removing imperceptible fluoride residue after chemical dry-cleaning to fabricate uniform low-resistance NiSi film-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Removing imperceptible fluoride residue after chemical dry-cleaning to fabricate uniform low-resistance NiSi film

Published:2011-09 Issue:5 Volume:29 Page:051203
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Futase Takuya,Tanioto Hisanori,Kimoto Mitsuo,Tsugane Hideaki,Suzuki Hidenori,Tobimatsu Hiroshi

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.3622301

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Solvent Design Methodology to Recycle Chamber Parts and Recover Platinum by Highly Selective Wet Treatment for Ni–Pt Sputtering System;Japanese Journal of Applied Physics;2013-11-01

2. Fluoride Contamination Induced ${\rm NiSi}_{2}$ Film Formation in a Gate NiSi Line;IEEE Transactions on Semiconductor Manufacturing;2013-08

3. Stress-induced voiding in nickel silicide;Microelectronic Engineering;2013-06

4. Uniform, Low-Resistive Ni-Pt Silicide Fabricated by Partial Conversion With Low Metal-Consumption Ratio;IEEE Transactions on Semiconductor Manufacturing;2011-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP