Demonstration of a silicon gated field emitter array based low frequency Colpitts oscillator at 400 °C

Author:

Bhattacharya Ranajoy1ORCID,Hay Robert1,Cannon Mason1,Karaulac Nedeljko2ORCID,Rughoobur Girish2ORCID,Akinwande Akintunde Ibitayo2,Browning Jim1ORCID

Affiliation:

1. Boise State University, Department of Electrical & Computer Engineering 1 , 1375 W University Dr. Boise, Idaho 83725

2. Massachusetts Institute of Technology, Department of Electrical Engineering & Computer Science 2 , 77 Massachusetts Ave., Cambridge, Massachusetts 02139

Abstract

Silicon gated field emitter arrays have been used as a vacuum transistor to demonstrate a 152 kHz Colpitts oscillator. The transfer and output characteristics of the 1000 × 1000 silicon arrays were measured using a collector placed ≈ 1 mm away with a gate voltage up to 40 V and a collector voltage up to 200 V. The data were used to establish an LTspice transistor model based on a field emission tip model and a collector current model that fit the characteristics. Then, the LTspice model was used to design a low frequency Colpitts oscillator. Furthermore, experiments were carried out to successfully demonstrate the oscillation. Oscillation frequency was 152 kHz with a peak to peak voltage of 25 V for a tip to ground series resistance value of 10 kΩ at 50 V on the gate and 210 V on the collector. Further, the oscillator was also tested at 50, 100, 200, 300, and 400 °C. It was observed that frequency shifts for each temperature which is due to the change in the overall capacitance of the test setup. This type of device could be used as a temperature sensor in harsh environments.

Funder

Air Force Office of Scientific Research

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

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