Author:
Broom Ronald F.,Mohr Theodor O.
Cited by
12 articles.
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1. Fabrication technology for lead‐alloy Josephson devices for high‐density integrated circuits;Journal of Applied Physics;1986-03
2. Josephson current deviation in small area junctions with double insulating layers;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1985-01
3. Josephson Integrated Circuits;Large Scale Integrated Circuits Technology: State of the Art and Prospects;1982
4. Niobium oxide-barrier tunnel junction;IEEE Transactions on Electron Devices;1980-10
5. Margins of a 16-ps/bit interferometer shift register;IEEE Transactions on Electron Devices;1980-10