Improving electron beam resist sensitivity by preexposure to deep ultraviolet radiation
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Published:2007
Issue:6
Volume:25
Page:2064
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ISSN:1071-1023
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:en
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Short-container-title:J. Vac. Sci. Technol. B
Author:
Murali Raghunath,Brown Devin,Martin Kevin P.,Meindl James D.
Publisher
American Vacuum Society
Subject
Electrical and Electronic Engineering,Condensed Matter Physics