Radiofrequency pulsed glow discharge-ToFMS depth profiling of a CdTe solar cell: A comparative study versus time of flight secondary ion mass spectrometry

Author:

Gonzalez-Gago Cristina,Pisonero Jorge,Bordel Nerea,Sanz-Medel Alfredo,Tibbetts Nicole J.,Smentkowski Vincent S.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Depth Profiling At A Steel-Aluminum Interface Using Slow-Flow Direct Current Glow Discharge Mass Spectrometry;Atomic Spectroscopy;2021-12-10

2. Glow Discharge Mass Spectrometry;Materials Characterization;2019

3. Depth profile analyses with sub 100-nm depth resolution of a metal thin film by femtosecond - laser ablation - inductively coupled plasma - time-of-flight mass spectrometry;Spectrochimica Acta Part B: Atomic Spectroscopy;2018-11

4. Depth profile analysis with glow discharge spectrometry;Journal of Analytical Atomic Spectrometry;2017

5. Combining plasma profiling TOFMS with TOF-SIMS depth profiling for microelectronic applications;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05

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