ToF-SIMS study of selective anchoring of Ru(tpy)2 complexes on zirconium-phosphate functionalized oxide surfaces
Author:
Affiliation:
1. Dipartimento di Scienze Chimiche and CSGI, Università degli Studi di Catania, V. le A. Doria 6, I 95125 Catania, Italy
2. Département de Chimie, Université de Montréal, 2900 Edouard-Montpetit, H3T-1J4 Montréal, Québec, Canada
Funder
Ministero dell'Istruzione, dell'Università e della Ricerca
Publisher
American Vacuum Society
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://avs.scitation.org/doi/pdf/10.1116/6.0000045
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