Affiliation:
1. Department of Biological Sciences, Columbia University 1 , New York, New York 10027
2. Department of Mechanical Engineering, University of California Merced 2 , Merced, California 95343
Abstract
Atomic-scale characteristics of surfaces, including their structure, chemical reactivity, and electronic properties, determine their roles in multiple fields of science and technology, e.g., as coatings, catalysts, and device components. As such, it is of utmost importance to study the atomic arrangement and atomic-scale physico-chemical properties of surfaces in real space in a robust and reliable manner. A powerful technique for achieving this goal is scanning probe microscopy (SPM). Here, we present an overview of SPM-based techniques for atomic-resolution surface imaging and spectroscopy and highlight selected advances in the field. We also discuss current challenges of SPM-based techniques for atomic-resolution surface studies.
Funder
Air Force Office of Scientific Research
Subject
Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials