Combined low‐energy ion scattering and x‐ray photoelectron spectroscopy study of Ta2O5 bombarded by 500

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Combined low‐energy ion scattering and x‐ray photoelectron spectroscopy study of Ta2O5 bombarded by 500–3000‐eV He ions

Published:1978-03 Issue:2 Volume:15 Page:702-705
ISSN:0022-5355
Container-title:Journal of Vacuum Science and Technology
language:en
Short-container-title:Journal of Vacuum Science and Technology

Author:

Nelson G. C.

Publisher

American Vacuum Society

Subject

General Engineering

Link

http://avs.scitation.org/doi/pdf/10.1116/1.569675

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of oxide surface metallization under ion-beam irradiation;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2013-03

2. Surface composition modification of tungsten higher oxide under He+ ion bombardment;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2012-04

3. Application of low energy ion scattering to oxidic surfaces;Materials Science Monographs;1995

4. A LEIS study of the surface structure of a molybdenum on γ-alumina catalyst;Surface Science;1992-01

5. Shielding effects in oxides studied by low-energy ion scattering;Surface Science;1991-08

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