Improvement in the method of searching for the fractal nature of rough thin‐film top surfaces-Reference-Cited by-同舟云学术

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Improvement in the method of searching for the fractal nature of rough thin‐film top surfaces

Published:1990-05 Issue:3 Volume:8 Page:1554-1559
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Varnier F.,Llabaria A.,Rasigni G.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.576764

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of Surface Roughness;Nanostructure Science and Technology;2007

2. Pooling analysis of scanning probe microscopy images;Surface Science;1998-05

3. Growth and fractal scaling nature of copper thin films on TiN surface by metal organic chemical vapor deposition from hexafluoroacethylacetonate Cu[sup (I)] vinyltrimethylsilane;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1997-11

4. Description of surface roughness as an approximate self-affine random structure;Surface Science;1995-07

5. How is the fractal dimension of a thin film top surface connected with the roughness parameters and anisotropy of this surface?;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1991-05

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