Author:
Woodall J. M.,Lanza C.,Freeouf J. L.
Cited by
21 articles.
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1. Temperature formation of structural defects in the interface of GaAs Schottky barrier;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1993-03
2. Ideal Schottky diodes on passivated silicon;Physical Review Letters;1992-11-02
3. The advanced unified defect model for Schottky barrier formation;Perspectives in Condensed Matter Physics;1990
4. Schottky barriers: An effective work function model;Perspectives in Condensed Matter Physics;1990
5. The advanced unified defect model for Schottky barrier formation;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1988-07