Growth of HgCdTe for long-wavelength infrared detectors using automated control from spectroscopic ellipsometry measurements
Author:
Publisher
American Vacuum Society
Subject
General Engineering
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 – xCdхTe Films Grown Using Molecular Beam Epitaxy;Optics and Spectroscopy;2021-01
2. Parametric Model of the Optical Constant Spectra of Hg1 – xCdxTe and Determination of the Compound Composition;Optics and Spectroscopy;2020-12
3. Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy;Instruments and Experimental Techniques;2016-11
4. Development of sensitive long-wave infrared detector arrays for passively cooled space missions;Optical Engineering;2013-04-29
5. Substrate wobble compensation for in situ spectroscopic ellipsometry measurements;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2011-05
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