Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy-Reference-Cited by-同舟云学术

Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

Published:2016-03 Issue:2 Volume:34 Page:023201
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Watanabe Yoshihide,Nishimura Yusaku F.,Suzuki Ryo,Uehara Hiromitsu¹,Nimura Tomoyuki²,Beniya Atsushi,Isomura Noritake,Asakura Kiyotaka,Takakusagi Satoru

Affiliation:

1. Catalysis Research Center, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan

2. AVC Co., Ltd., Inada 1450-6, Hitachinaka, Ibaraki 312-0061, Japan

Funder

Japan Society for the Promotion of Science (JSPS)

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4936344

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