Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy

Published:2020-03 Issue:2 Volume:38 Page:023209
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A
language:en
Short-container-title:Journal of Vacuum Science & Technology A

Author:

Powell Cedric J.¹^ORCID

Affiliation:

1. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8370

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.5141079

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