Atomic force microscopy: General aspects and application to insulators-Reference-Cited by-同舟云学术

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Atomic force microscopy: General aspects and application to insulators

Published:1988-03 Issue:2 Volume:6 Page:275-278
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Heinzelmann H.,Meyer E.,Grütter P.,Hidber H.‐R.,Rosenthaler L.,Güntherodt H.‐J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.575424

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4. Microscopy of Coatings;Encyclopedia of Analytical Chemistry;2006-09-15

5. Atomic scale imaging of amorphous silicate glass surfaces by scanning force microscopy;Journal of Non-Crystalline Solids;2005-05

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