Accuracy limitations for composition analysis by XPS using relative peak intensities: LiF as an example
Author:
Affiliation:
1. C. R. Brundle and Associates, Soquel, California 95073
2. The XPS Library, Salem, Oregon 97306
3. Department of Chemistry, University of North Texas, Denton, Texas 76203-5017
Funder
DOE
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/am-pdf/10.1116/6.0000674
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