Method for atomic-layer-resolved measurement of polarization fields by nuclear magnetic resonance-Reference-Cited by-同舟云学术

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Method for atomic-layer-resolved measurement of polarization fields by nuclear magnetic resonance

Published:2000 Issue:4 Volume:18 Page:2255
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Kempf James G.,Weitekamp Daniel P.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Conclusions and Outlook;Electrical Control and Quantum Chaos with a High-Spin Nucleus in Silicon;2021

3. Microscopic Crystalline Origins of the Quadrupole Interaction;Electrical Control and Quantum Chaos with a High-Spin Nucleus in Silicon;2021

4. A combined experimental setup for OP and ODNMR;Journal of Magnetic Resonance;2017-08

5. Scanning nuclear electric resonance microscopy using quantum-Hall-effect breakdown;AIP Advances;2016-07

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