Investigation of molecular beam epitaxial NdF[sub 3]/Si(111) heterostructures by atomic force microscopy and x-ray diffractometry
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Published:2001
Issue:6
Volume:19
Page:2007
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:en
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Short-container-title:J. Vac. Sci. Technol. B
Author:
Ko J. M.,Durbin S. D.,Fukuda T.,Inaba K.
Publisher
American Vacuum Society
Subject
General Engineering