Low-macroscopic field emission structure: Using the shape of the conductor to identify a local difference in electric potential

Author:

Lapena Laurent1,Degiovanni Alain1,Tishkova Victoria1ORCID,Salançon Evelyne1ORCID

Affiliation:

1. CINaM, Aix-Marseille Univ., CNRS, UMR7325, Marseille 13288 Marseille cedex 9, France

Abstract

The emission of electrons from an insulating crystal deposited on a conductor occurs at a macroscopic electric field of a few volts per micrometer, 3 orders of magnitude below the field emission from a clean metal. This is due to the local field enhancement induced by the presence of the insulating crystal. The emission profiles depend on the shape of the conductive substrate; analyzing these profiles enables the local difference in electric potential and the opening angle to be traced. Given the thickness of the crystal, the local difference in potential indicates the local field enhancement of a few volts per nanometer applied to the conductor.

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

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