Structure of ultrathin SiO2/Si(111) interfaces studied by photoelectron spectroscopy-Reference-Cited by-同舟云学术

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Structure of ultrathin SiO2/Si(111) interfaces studied by photoelectron spectroscopy

Published:1999-07 Issue:4 Volume:17 Page:1250-1257
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Keister J. W.,Rowe J. E.,Kolodziej J. J.,Niimi H.,Tao H.-S.,Madey T. E.,Lucovsky G.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.581805

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