Electromagnetically induced transparency based Rydberg-atom sensor for traceable voltage measurements

Author:

Holloway Christopher L.1ORCID,Prajapati Nikunjkumar1ORCID,Sherman Jeffery A.1,Rüfenacht Alain1,Artusio-Glimpse Alexandra B.1,Simons Matthew T.1ORCID,Robinson Amy K.2ORCID,La Mantia David S.34,Norrgard Eric B.3ORCID

Affiliation:

1. National Institute of Standards and Technology, Boulder, Colorado 80305, USA

2. Department of Electrical Engineering, University of Colorado, Boulder, Colorado 80305, USA

3. National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA

4. University of Maryland, College Park, Maryland 20740, USA

Abstract

We investigate the Stark shift in Rydberg rubidium atoms through electromagnetically induced transparency for the measurement of direct current (dc) and 60 Hz alternating current (ac) voltages. This technique has direct application to the calibration of voltage measurement instrumentation. We present experimental results for different atomic states that allow for dc and ac voltage measurements ranging from 0 to 12 V. While the state-of-the-art method for realizing the volt, the Josephson voltage standard, is significantly more accurate, the Rydberg atom-based method presented here has the potential to be a calibration standard with more favorable size, weight, power, and cost. We discuss the steps necessary to develop the Rydberg atom-based voltage measurement as a complementary method for dissemination of the voltage scale directly to the end user and discuss sources of uncertainties for these types of experiments.

Publisher

American Vacuum Society

Subject

Electrical and Electronic Engineering,Computational Theory and Mathematics,Physical and Theoretical Chemistry,Computer Networks and Communications,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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