X‐ray and Auger‐electron yields for quantitative element analysis
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.574640
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A new direct method to determine total atomic photoelectric cross sections at 123.6 keV;International Journal of Radiation Applications and Instrumentation. Part A. Applied Radiation and Isotopes;1992-03
2. Problems with the analysis of glass and glass ceramic surfaces and coatings;Fresenius' Zeitschrift für analytische Chemie;1989-01
3. Coster-Kronig factorf13ofY39measured with the synchrotron photoionization method;Physical Review A;1989-01-01
4. L-vacancy decay in heavy elements (72≤Z≤82) by the synchrotron photoionization method;Physical Review A;1988-10-01
5. RADIATIVE, AUGER, AND COSTER-KRONIG YIELDS OBTAINED BY THE SYNCHROTON PHOTOIONIZATION TECHNIQUE;Le Journal de Physique Colloques;1987-12
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