Author:
Chan William S.,Wan Jarm T.
Cited by
9 articles.
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1. Study of insulator traps in InSb InSb/SiOx/Metal devices;Journal of Applied Physics;2010-04-15
2. Growth and characterization of thin anodic oxide films on n-InSb(100) formed in aqueous solutions;Corrosion Science;2004-08
3. Intrinsic infrared detectors;Progress in Quantum Electronics;1988-01
4. Studies of SiOx anodic native oxide interfaces on InSb;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1986-09
5. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986