Axial resistivity measurement of a nanopillar ensemble using a cross-bridge Kelvin architecture-Reference-Cited by-同舟云学术

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Axial resistivity measurement of a nanopillar ensemble using a cross-bridge Kelvin architecture

Published:2013-05 Issue:3 Volume:31 Page:031502
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Lalany Abeed,Tucker Ryan Thomas,Taschuk Michael Thomas,Fleischauer Michael David,Brett Michael Julian

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4794182

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Perspectives on oblique angle deposition of thin films: From fundamentals to devices;Progress in Materials Science;2016-03

2. Substrate temperature control for the formation of metal nanohelices by glancing angle deposition;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-11

3. Formation and Characterization of the High Precision Nanoscale Thin Film Resistors on Radio Frequency Application;International Journal of Electrochemical Science;2015-08

4. Anisotropic In-Plane Conductivity and Dichroic Gold Plasmon Resonance in Plasma-Assisted ITO Thin Films e-Beam-Evaporated at Oblique Angles;ACS Applied Materials & Interfaces;2015-05-12

5. Post-Deposition Processing and Device Integration;Glancing Angle Deposition of Thin Films;2014-07-12

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