Interpreting Tests of School VAM Validity

Author:

Angrist Joshua1,Hull Peter2,Pathak Parag3,Walters Christopher4

Affiliation:

1. Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, and NBER (e-mail: )

2. Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139 (e-mail: )

3. Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, and NBER (e-mail: )

4. University of California, Berkeley, 530 Evans Hall, Berkeley, CA 94720, and NBER (e-mail: )

Abstract

We develop over-identification tests that use admissions lotteries to assess the predictive value of regression-based value-added models (VAMs). These tests have degrees of freedom equal to the number of quasi-experiments available to estimate school effects. By contrast, previously implemented VAM validation strategies look at a single restriction only, sometimes said to measure forecast bias. Tests of forecast bias may be misleading when the test statistic is constructed from many lotteries or quasi-experiments, some of which have weak first stage effects on school attendance. The theory developed here is applied to data from the Charlotte-Mecklenberg School district analyzed by Deming (2014).

Publisher

American Economic Association

Subject

Economics and Econometrics

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