Thickness dependence of temperature coefficient of resistance and neel temperature in MnTe films-Reference-Cited by-同舟云学术

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Thickness dependence of temperature coefficient of resistance and neel temperature in MnTe films

Published:1993 Issue:13 Volume:12 Page:1052-1056
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Thanigaimani V.,Angadi M. A.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00420217.pdf

Reference23 articles.

1. D. Dalven, Infrared Phys. 9 (1969) 141.

2. A. K. Sharma and B. Singh, Indian J. Pure & Appl. Phys. 23 (1985) 135.

3. j. conragan and r. s. muller, The 1970 Solid State Sensors Symposium Conference Record, IEEE, Catalogue, No. 70C25-Sensor, P-52.

4. Prabhat Singh, Indian J. Pure & Appl. Phys. 18 (1980) 950.

5. m. a. angadi and v. thanigaimani, Thin Solid Films (Submitted).

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