Direct ion beam deposition of polymeric styrene films and in situ characterization by electron spectroscopy-Reference-Cited by-同舟云学术

Direct ion beam deposition of polymeric styrene films and in situ characterization by electron spectroscopy

Published:1990-12 Issue:6 Volume:51 Page:526-536
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Ugolini D.,Tuilier M. -H.,Eitle J.,Schelz S.,Wang J. Q.,Oelhafen P.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00324737.pdf

Reference19 articles.

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3. C. Weissmantel, K. Bewilogua, C. Sch�rer, K. Breuer, Z. Zscheile: Thin Solid Films 61, L 1 (1979)

4. M.J. Mirtich: In Amorphous Hydrogenated Carbon Films, ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 377

5. P. Oelhafen, D. Ugolini: ?Photoelectron spectroscopy measurements on in situ prepared a-C: H films?. In Amorphous Hydrogenated Carbon Films, ed. by P. Koidl, P. Oelhafen (Les Editions de Physique, Les Ulis 1987) p. 267

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