Use of an ultrasonic resonance technique to measure the in-plane Young's modulus of thin diamond films deposited by a d.c. plasma jet-Reference-Cited by-同舟云学术

Use of an ultrasonic resonance technique to measure the in-plane Young's modulus of thin diamond films deposited by a d.c. plasma jet

Published:1993 Issue:3 Volume:12 Page:191-195
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Chandra L.,Clyne T. W.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00819956.pdf

Reference19 articles.

1. R. C. Devries,Ann. Rev. Mater. Sci. 17 (1987) 161.

2. P. K. Bachmann,Diamond Related Mater. 1 (1991) 1.

3. P. K. Bachmann, D. Leers andD. U. Wiechert,Int. J. Phys. Chem. 95 (1991) 1390.

4. P. R. Chalker andC. Johnston, in Proceedings of the 2nd European Conference on Advanced Materials and Processes, (Euromat 91), 22?24 July 1991, Cambridge, edited by T. W. Clyne and P. J. Withers (Institute of Materials, Cambridge, 1992) p. 217.

5. K. Kurihara, K. Sasaki, M. Kawarada andN. Koshino,J. Appl. Phys. Lett. 52 (1988) 437.

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