Author:
,Barlag S.,Becker H.,B�hringer T.,Bosman M.,Castillo V.,Chabaud V.,Buchholz D.,Damerell C.,Daum C.,Dietl H.,Fawcett H.,Gill S.,Gillman A.,Gilmore R.,Gooch T.,G�rlich L.,Gras P.,Hajduk Z.,Higon E.,Hyams B. D.,Kelsey D. P.,Kemmer J.,Klanner R.,K�tz U.,Kwan S.,L�cking B.,L�tiens G.,Lutz G.,Malos J.,M�nner W.,Neugebauer E.,Palka H.,Pep� M.,Richardson J.,Rijk G.,Rybicki K.,Seebrunner H. J.,Stierlin U.,Tiecke H. G.,Turala M.,Waltermann G.,Watts S.,Weilhammer P.,Wickens F.,Wiggers L. W.,Wylie A.,Zeludziewicz T.
Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous),Engineering (miscellaneous),Physics and Astronomy (miscellaneous),Physics and Astronomy (miscellaneous)
Reference12 articles.
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