Electronic characterization of heterojunctions by surface potential monitoring-Reference-Cited by-同舟云学术

Electronic characterization of heterojunctions by surface potential monitoring

Published:1995-07 Issue:7 Volume:24 Page:893-901
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Kronik L.,Leibovitch M.,Fefer E.,Korobov V.,Shapira Yoram

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02653338.pdf

Reference42 articles.

1. C. Weisbuch and B. Vinter,Quantum Semiconductor Struc- tures (San Diego: Academic Press, 1991).

2. R.L. Anderson,Sol. State Electron. 5, 341 (1962).

3. F. Capasso and G. Margaritondo, eds.,Heterojunction Band Discontinuities (Amsterdam: North-Holland, 1987), and ref- erences therein.

4. For a recent overview on the state of the art in this field, see theProc. 20th Annual Conf. Physics and Chemistry of Semi- conductor Interfaces, Williamsburg (1993) (and references therein), inJ. Vac. Sci. Techn. B11 (4) (1993), and especially the reviews of G. Margaritondo and H. Kroemer therein.

5. G. Margaritondo,J. Vac. Sci. B11, 1362 (1993).

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