1. Lofstrom, K., Daasch, W.R., Taylor, D.: IC identification circuit using device mismatch. In: 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No. 00CH37056) (IEEE), pp. 372–373 (2000)
2. Gassend, B., Clarke, D., van Dijk, M., Devadas, S.: Silicon physical random functions. In: Proceedings of the 9th ACM Conference on Computer and Communications Security (ACM), pp. 148–160 (2002)
3. Pappu, R., Recht, B., Taylor, J., Gershenfeld, N.: American association for the advancement of science. Physical one-way functions. Science 297(5589), 2026–2030 (2002)
4. Rührmair, U., Holcomb, D.E.: PUFs at a glance. In: Proceedings of the Conference on Design, Automation and Test in Europe (European Design and Automation Association), p. 347 (2014)
5. Holcomb, D.E., Burleson, W.P., Fu, K.: Initial SRAM state as a fingerprint and source of true random numbers for RFID tags. In: Proceedings of the Conference on RFID Security, vol. 7 (2007)