1. Hu, Y., Ye, X., Zheng, B., Zhao, Z., Zhai, G.: Degradation mechanisms-based reliability modeling for metallized film capacitors under temperature and voltae stresses. https://doi.org/10.1016/J.MICROREL.2022.114609
2. Zhao, L., Wang, X., Tong, K., et al.: Reliable Life
prediction method for metallized film capacitors. Industrial Technol. Innovation 7(4), 113–115 (2020). (in Chinese)
3. He, H.: Development of high voltage, large capacity and long life pulse capacitor. Henan Sci. Technol. 749(15), 41–44 (2021). (in Chinese)
4. Gorpinich, A.: Evaluation of functional reliability indices for DC-link capacitors in pulse-width modulation converters.https://doi.org/10.1051/matecconf/201711301004
5. Zha, K., Cao, J., et al.: Reliability evaluation of MMC Converter valve assembly considering metallized film capacitor failure. Autom. Electric Power Syst. 43(4), 86–96 (2019). (in Chinese)