Author:
Saranya M. N.,Sridevi Sriadibhatla,Nagulapalli Rajasekhar
Publisher
Springer Nature Singapore
Cited by
1 articles.
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1. A Noise and Mismatch Improved Charge Pump for PLL in 28nm CMOS Technology;2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S);2024-06-08