Author:
Li Yi-Hsien,Cheng Chi-Cheng
Publisher
Springer Nature Singapore
Reference13 articles.
1. Singh, R.B., Kumar, G., Sultania, G., Agashe, S.S., Sinha, P.R., Kang, C.: Deep learning based MURA defect detection. EAI Endorsed Trans. Cloud Syst. 5, e6 (2019)
2. Nguyen, V., Pham, H., Cui, X., Ma, M., Kim, H.: Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision. J. Inform. Telecommun. 1, 334–350 (2017)
3. Deng, Y.S., Luo, A.C., Dai, M.J.: Building an automatic defect verification system using deep neural network for PCB defect classification. In: 2018 4th International Conference on Frontiers of Signal Processing (ICFSP), pp. 145–149 (2018)
4. Chien, J.-C., Wu, M.-T., Lee, J.-D.: Inspection and classification of semiconductor wafer surface defects using CNN deep learning networks. Appl. Sci. 10, 5340 (2020)
5. Bunrit, S., Kerdprasop, N., Kerdprasop, K.: Improving the representation of CNN based features by autoencoder for a task of construction material image classification. J. Adv. Inform. Technol. 11, 192–199 (2020)