1. Abbe E (1890) Meßapparate für Physiker. Z Instrumentenkd 10:446–448
2. Balzer FG, Hausotte T, Dorozhovets N, Manske E, Jäger G (2011) Tactile 3D microprobe system with exchangeable styli. Meas Sci Technol 22(9): 094018 (7pp), IOP Publishing, Bristol. ISSN 13616501
3. Birli O, Franke K-H, Linß G, Machleidt T, Manske E, Schale F, Schwannecke H-C, Sparrer E, Weiß M (2013) Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine. In: Conference: optical measurement systems for industrial inspection VIII. In: Proceedings of SPIE: Munich, Germany, 13–16 May 2013.vol 8788, pp 87880X (7 pp)
4. Büchner H-J, Jäger G (2006) A novel plane mirror interferometer without using corner cube reflectors. Meas Sci Technol 17:746–752
5. Dorozhovets N, Hausotte T, Jäger G, Manske E (2007)Application of the metrological scanning probe microscope for high-precision, long-range, traceable measurements. In: Proc. of the SPIE 6616 (2007): Munich, Germany, 661624 (7 pp)