Signal Sensing of Electrically Controlled Metamaterials Based on Terahertz Time-Domain Spectra (THz-TDS)
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Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-99-2965-8_8
Reference14 articles.
1. Krishnamurthy S, Reiten MT, Harmon SA, et al. Characterization of thin polymer films using terahertz time-domain interferometry. Appl Phys Lett. 2001;79(6):875–7.
2. Lee KS, Lu TM, Zhang XC. The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. Microelectron J. 2003;34:63–9.
3. Brucherseifer M, Bolivar PH, Kurz H. Combined optical and spatial modulation THz-spectroscopy for the analysis of thin-layered systems. Appl Phys Lett.2002;81(10):1791–93.
4. Hashimshony D, Geltner I, Cohen G, et al. Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy. J Appl Phys. 2001;90(11):5778–81.
5. Dai J, Xie X, Zhang XC. Detection of broadband terahertz waves with a laserinduced plasma in gases. Phys Rev Lett. 2006;97(10): 103903.
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