Author:
Menexis Antonios N.,Koumboulis Fotis N.,Fragkoulis Dimitrios G.,Kouvakas Nikolaos D.
Publisher
Springer Nature Singapore
Reference28 articles.
1. Abudureheman M, Jiang Q, Gong J, Yiming A (2023) Technology-driven smart manufacturing and its spatial impacts on carbon emissions: evidence from China. Comput Ind Eng 181:109283
2. Chien C-F, Hung W-T, Liao ET-Y (2022) Redefining monitoring rules for intelligent fault detection and classification via CNN transfer learning for smart manufacturing. IEEE Trans Semicond Manuf 35(2):158–165
3. Dai W, Vyatkin V (2010) Redesign distributed IEC 61131–3 PLC system in IEC 61499 function blocks. In: 2010 IEEE 15th conference on emerging technologies & factory automation (ETFA 2010), Bilbao, Spain, pp 1–8
4. EU Parliament homepage (2023) https://www.europarl.europa.eu/news/en/press-room/20230707IPR02418/semiconductors-meps-adopt-legislation-to-boost-eu-chips-industry. Accessed on 14 July 2023
5. Fan S-KS, Hsu C-Y, Tsai D-M, He F, Cheng C-C (2020) Data-driven approach for fault detection and diagnostic in semiconductor manufacturing. IEEE Trans Autom Sci Eng 17(4):1925–1936