Author:
Nath Debasish,Jain Arihant,Tapas V. K.,Joshi N. S.,Varde P. V.
Reference12 articles.
1. R.B. Fair, Challenges to manufacturing submicron, ultra-large scale integrated circuits. Proc. IEEE 78(11), 1687 (1990)
2. C.T. Sah, Evolution of the MOS transistor-from conception to VLSI. Proc. IEEE 76(10), 1280–1326 (1988)
3. A. Reisman, Device, circuit and technology scaling to micron and submicron dimensions. Proc. IEEE 71(5), 550 (1983)
4. J.M. Soden, R.E. Anderson, IC failure analysis: techniques and tools for quality and reliability improvement. Proc. IEEE 81(5), 703–715 (1993)
5. J.C.H. Phang, D.S.H. Chan, S.L. Tan, W.B. Len, K.H. Yim, L.S. Koh, C.M. Chua, L.J. Balk, A review of near infrared photon emission microscopy and spectroscopy, in Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits (2005), pp. 275–281
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献