1. J.A. Cruz, Applicability and Limitations of Reliability Allocation Methods (NASA, Glenn Research Center, Cleveland, Ohio)
2. Reliability Allocation Using Lambda Predict—Weibull.com
3. K. Choudhary, N. Kumar, S. Monisha, High Switching Beam Focusing Electrode Circuit MOSFETs Reliability Analysis (Microwave Tube Research & Development Centre (MTRDC), Bangalore, India)
4. PTC Windchill Quality Solutions 10.2 documents and software
5. MIL-HDBK-338, Electronic Reliability Design Handbook