Electrical and Electronics Metrology: From Quantum Standard to Applications in Industry and Strategic Sectors-Reference-Cited by-同舟云学术

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Electrical and Electronics Metrology: From Quantum Standard to Applications in Industry and Strategic Sectors

Published:2020 Issue: Volume: Page:457-521
ISSN:
Container-title:Metrology for Inclusive Growth of India
language:
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Author:

Somkuwar Atul S.,Satish ,Siwach Praveen K.,Kumar Ajeet,Shukla Ajay K.,Kushvaha Sunil S.,Rakshit Rajib K.,Jain Priyanka,Meena R. S.,Sahoo Sangeeta,Aloysius R. P.,Dogra Anjana,Singh Manju,Ansari M. A.,Khanna Suraj P.,Pulikkotil Jiji,Singh H. K.,Awana VPS,Biswas J. C.

Publisher

Springer Singapore

Link

https://link.springer.com/content/pdf/10.1007/978-981-15-8872-3_10

Reference134 articles.

1. 9th Edition The International System of Units (2009)

2. B.D. Josephson, Possible new effects in superconductive tunnelling. Phys. Lett. 1(7), 251–253 (1962). https://doi.org/10.1016/0031-9163(62)91369-0

3. F. Delahaye, B. Jeckelmann, Revised technical guidelines for reliable dc measurements of the quantized Hall resistance. Metrologia 40(5), 217–223 (2003). https://doi.org/10.1088/0026-1394/40/5/302

4. BIPM: Key Comparison Database KCDB. https://www.bipm.org/kcdb/

5. B. Ehtesham, P.S. Bist, T. John, Erratum to: development of an automated precision direct current source for generation of pA currents based on capacitance charging method at CSIR-NPL. MAPAN 32(1), 23–23 (2017). https://doi.org/10.1007/s12647-017-0204-x

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