Evaluation of Back-Side Slits with Sub-millimeter Resolution Using a Differential AMR Probe-Reference-Cited by-同舟云学术

Evaluation of Back-Side Slits with Sub-millimeter Resolution Using a Differential AMR Probe

Published:2020-07-08 Issue: Volume: Page:319-328
ISSN:1876-1100
Container-title:Lecture Notes in Electrical Engineering
language:
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Author:

Zaini M. A. H. P.,Saari M. M.,Nadzri N. A.,Halil A. M.,Hanifah A. J. S.,Tsukada K.

Publisher

Springer Singapore

Link

http://link.springer.com/content/pdf/10.1007/978-981-15-5281-6_22

Reference15 articles.

1. Tsukada K, Kiwa T, Kawata T, Ishihara Y (2006) Low-frequency eddy current imaging using mr sensor detecting tangential magnetic field components for nondestructive evaluation. IEEE Trans Magn 42:3315–3317

2. Postolache O, Ribeiro AL, Ramos H (2009) Weld testing using eddy current probes and image processing. In: 19th IMEKO World Congress 2009, pp 6–10

3. García-Martín J, Gómez-Gil J, Vázquez-Sánchez E (2011) Non-destructive techniques based on eddy current testing. Sensors 11:2525–2565

4. Zaini MAHP, Saari MM, Nadzri NA, Mohd Halil A, Tsukada K (2019) An MFL probe using shiftable magnetization angle for front and back side crack evaluation. In: Proceedings - 2019 IEEE 15th International Colloquium on Signal Processing and Its Applications, CSPA 2019, pp 157–161

5. Sophian A, Tian G, Fan M (2017) Pulsed eddy current non-destructive testing and evaluation: a review. Chin. J. Mech. Eng. 30:500–514

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