Unsupervised Learning for Wafer Surface Defect Pattern Recognition
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-6372-7_32
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1. Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning;Journal of Intelligent Manufacturing;2024-07-01
2. Enhanced Prediction of Semiconductor Wafer Defects through CNN Forest Fusion and Random Methods for Improved Efficiency;2024 International Conference on Advances in Modern Age Technologies for Health and Engineering Science (AMATHE);2024-05-16
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