PHI: Pseudo-HAL Identification for Scalable Firmware Fuzzing-Reference-Cited by-同舟云学术

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PHI: Pseudo-HAL Identification for Scalable Firmware Fuzzing

Published:2024 Issue: Volume: Page:60-80
ISSN:0302-9743
Container-title:Lecture Notes in Computer Science
language:en
Short-container-title:

Author:

Jeong Seyeon,Hwang Eunbi,Cho Yeongpil,Kwon Taekyoung

Publisher

Springer Nature Singapore

Link

https://link.springer.com/content/pdf/10.1007/978-981-97-1238-0_4

Reference26 articles.

1. State of IoT_spring-2023. https://iot-analytics.com/product/state-of-iot-spring-2023/

2. National vulnerability database. https://nvd.nist.gov/vuln/. Accessed 1 June 2021

3. HAL_Fuzz. https://github.com/ucsb-seclab/hal-fuzz. Accessed 1 June 2021

4. Libmatch. https://github.com/subwire/libmatch. Accessed 1 June 2021

5. 2019 Embedded markets study (2019). https://www.embedded.com/wp-content/uploads/2019/11/EETimes_Embedded_2019_Embedded_Markets_Study.pdf. Accessed 1 June 2021

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