Measurement of Signal-to-Noise Ratio and Signal-to-Noise and Distortion Ratio Using Histogram Test in Time Domain Analysis
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-2877-1_36
Reference9 articles.
1. Zhang, Z., Shan Y., Dong, Y.: A 16 bit 200 kS/s successive approximation register ADC with foreground on-chip self-calibration. Institute of Electronics, Information and Communication Engineers May, 2020 (2020)
2. Wang, G.C., Zhu, Y., Chan, C.-H.: Gain error calibration for Two step ADCs: optimization either in accuracy or chip area. IEEE Trans. Low Power VLSI (2017)
3. Yuan, Tang, Miao: Analog to digital converter performance testing based on MATLAB. In: IOP Conference Series; Earth and Environment Science (2019)
4. Garg, B., Mishra, D.K.: Dynamic testing of ADC: a review. Int. J. Adv. Res. Technol 1(4) (2012)
5. Ting, H.W., Liu, B.-D., Chang, S.J.: A histogram based testing method for estimating/D converter performance. IEEE Trans. Instrum. Measur. 57(2), 420–427 (2008)
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