Discovering Optimal Patterns for Forensic Pattern Warehouse

Author:

Agarwal Vishakha,Tiwari Akhilesh,Gupta R. K.,Singh Uday Pratap

Publisher

Springer Singapore

Reference8 articles.

1. Han, J., Kamber, M.: Data Mining: Concepts and Techniques. Morgan Kaufmann, San Francisco (2006)

2. Bartolini, I., Bertino, E., Catania, B., Ciaccia, P., Golfarelli, M., Patella, M., Rizzi, S.: Patterns for next-generation database systems: preliminary results of the PANDA Project. In: 11th Proceedings of Italian Symposium on Advanced Database Systems, pp. 1–8. Cetraro (CS), Italy (2003)

3. Rizzi, S.: UML-based conceptual modeling of pattern-bases. In: Proceedings of the International Workshop on Pattern Representation and Management, pp. 1–11. Hellas (2005)

4. Terrovitis, M., Vassiliadis P., Skiadopoulos, S.: Modeling and language support for the management of pattern-bases. Data Knowl. Eng. 368–397. Elsevier (2007)

5. Evangelos, E., Kotsifakos, E.: Pattern-miner: integrated management and mining over data mining models. In: 14th Proceedings of ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, pp. 1081–1084 (2008)

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