Fan-In Technology

Author:

Lau John H.

Publisher

Springer Nature Singapore

Reference66 articles.

1. Elenius, P., and H. Yang. 1998. The UltraCSP wafer-scale package. High-Density Interconnect 1 (6): 36–40.

2. Lau, J.H., and S.W.R. Lee. 1999. Chip Scale Package. New York: McGraw-Hill Book Company.

3. Lau, J. H., T. Chung, R. Lee, C. Chang, and C. Chen. 1999. A novel and reliable Wafer-Level Chip Scale Package (WLCSP). In Proceedings of the Chip Scale International Conference, SEMI, September 1999, H1–8.

4. Wu, M., S. Chung, and D. Yu. 2016. UFI (UBM-free integration) fan-in WLCSP technology enables large die fine-pitch packages. In IEEE/ECTC Proceedings, May 2016, 1154–1159.

5. Yasunaga, M., S. Baba, M. Matsuo, H. Matsushima, S. Nakao, and T. Tachikawa. 1994. Chip scale package: A lightly dressed LSI chip. In Proceedings of IEEE/CPMT International Electronics Manufacturing Technology Symposium, La Jolla, CA, 1994, 169–176.

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