Junction Temperature Extraction of the Power Semiconductor Device
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-3132-1_4
Reference27 articles.
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5. Sathik MHM, Pou J, Prasanth S et al (2017) Comparison of IGBT junction temperature measurement and estimation methods-a review. In: 2017 Asian conference on energy, power and transportation electrification (ACEPT), pp 1–8
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